Inferential statistics of electron backscatter diffraction data from within individual crystalline grains

Peter Edmund Jupp, Bachmann Florian, Ralph Hielscher, Wolfgang Pantleon, Helmut Schaeben, Elias Wegert

Research output: Contribution to journalArticlepeer-review

86 Citations (Scopus)
Original languageEnglish
Pages (from-to)1338-1355
Number of pages18
JournalJournal of Applied Crystallography
Volume43
DOIs
Publication statusPublished - 2010

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