Abstract
We report on the realization and study of laterally contacted quantum dot (QD)-micropillars. The lateral contacts are formed by ion beam induced deposition and allow for the application of in-plane electric fields. The processing was optimized to preserve high optical quality of the QD-micropillars and to minimize detrimental leakage currents while providing a good electrical control of the QD properties. Under variation of the applied voltage we are able to Stark-tune the emission energy of the QDs up to 0.12 meV and to reduce their fine structure splitting by up to a factor of 5. (C) 2011 American Institute of Physics. [doi:10.1063/1.3589975]
| Original language | English |
|---|---|
| Article number | 191111 |
| Number of pages | 3 |
| Journal | Applied Physics Letters |
| Volume | 98 |
| Issue number | 19 |
| DOIs | |
| Publication status | Published - 9 May 2011 |
Keywords
- FOCUSED ION-BEAM
- ELECTRIC-FIELD
- PLATINUM
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