In-plane manipulation of quantum dots in high quality laterally contacted micropillar cavities

J. Beetz*, C. Kistner, M. Lermer, C. Schneider, S. Reitzenstein, Sven Höfling, M. Kamp, A. Forchel

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

Abstract

We report on the realization and study of laterally contacted quantum dot (QD)-micropillars. The lateral contacts are formed by ion beam induced deposition and allow for the application of in-plane electric fields. The processing was optimized to preserve high optical quality of the QD-micropillars and to minimize detrimental leakage currents while providing a good electrical control of the QD properties. Under variation of the applied voltage we are able to Stark-tune the emission energy of the QDs up to 0.12 meV and to reduce their fine structure splitting by up to a factor of 5. (C) 2011 American Institute of Physics. [doi:10.1063/1.3589975]

Original languageEnglish
Article number191111
Number of pages3
JournalApplied Physics Letters
Volume98
Issue number19
DOIs
Publication statusPublished - 9 May 2011

Keywords

  • FOCUSED ION-BEAM
  • ELECTRIC-FIELD
  • PLATINUM

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