Abstract
In-plane temperature dependent dielectric behavior of BiFeO3 (BFO) as-grown thin films show diffuse but prominent phase transitions near 450 (+/- 10)?K and 550?K with dielectric loss temperature dependences that suggest skin layer effects. The 450?K anomalies are near the transition first reported by Polomska et al. [Phys. Status Solidi 23, 567 (1974)]. The 550?K anomalies coincide with the surface phase transition recently reported [Marti et al., Phys. Rev. Lett. 106, 236101 (2011)]. In addition, anomalies are found at low temperatures: After several experimental cycles, the dielectric loss shows a clear relaxor-like phase transition near what was previously suggested to be a spin reorientation transition (SRT) temperature (similar to 201?K) for frequencies 1?kHz?
Original language | English |
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Pages (from-to) | 1207-1212 |
Number of pages | 6 |
Journal | Physica Status Solidi. A |
Volume | 209 |
Issue number | 7 |
DOIs | |
Publication status | Published - Jul 2012 |
Keywords
- multiferroics
- in-plane functional properties
- bismuth ferrite
- thin films
- interdigital electrodes
- THIN-FILM HETEROSTRUCTURES
- RELAXOR FERROELECTRICS
- MAGNETIC-PROPERTIES
- PMN-XPT
- CRYSTALS
- DOMAIN