In-plane dielectric and magnetoelectric studies of BiFeO3

Ashok Kumar*, J. F. Scott, R. Martinez, G. Srinivasan, R. S. Katiyar

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

28 Citations (Scopus)

Abstract

In-plane temperature dependent dielectric behavior of BiFeO3 (BFO) as-grown thin films show diffuse but prominent phase transitions near 450 (+/- 10)?K and 550?K with dielectric loss temperature dependences that suggest skin layer effects. The 450?K anomalies are near the transition first reported by Polomska et al. [Phys. Status Solidi 23, 567 (1974)]. The 550?K anomalies coincide with the surface phase transition recently reported [Marti et al., Phys. Rev. Lett. 106, 236101 (2011)]. In addition, anomalies are found at low temperatures: After several experimental cycles, the dielectric loss shows a clear relaxor-like phase transition near what was previously suggested to be a spin reorientation transition (SRT) temperature (similar to 201?K) for frequencies 1?kHz?

Original languageEnglish
Pages (from-to)1207-1212
Number of pages6
JournalPhysica Status Solidi. A
Volume209
Issue number7
DOIs
Publication statusPublished - Jul 2012

Keywords

  • multiferroics
  • in-plane functional properties
  • bismuth ferrite
  • thin films
  • interdigital electrodes
  • THIN-FILM HETEROSTRUCTURES
  • RELAXOR FERROELECTRICS
  • MAGNETIC-PROPERTIES
  • PMN-XPT
  • CRYSTALS
  • DOMAIN

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