Projects per year
Abstract
Original language | English |
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Article number | 2400179 |
Number of pages | 10 |
Journal | Advanced Physics Research |
Volume | Early View |
Early online date | 12 Jan 2025 |
DOIs | |
Publication status | E-pub ahead of print - 12 Jan 2025 |
Keywords
- Band engineering
- Half-Heusler thermoelectrics
- Impurity brands
- Seebeck effect
- TiNiSn
Fingerprint
Dive into the research topics of 'Impurity band formation as a route to thermoelectric power factor enhancement in n-type XNiSn half-Heuslers'. Together they form a unique fingerprint.Projects
- 3 Finished
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Light Element Analysis Facility (LEAF): Light Element Analysis Facility (LEAF)
Irvine, J. T. S. (PI), Baker, R. (CoI) & Miller, D. N. (CoI)
5/04/20 → 4/04/23
Project: Standard
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Electon Microscopy: Electon Microscopy for the characterisation and manipulation of advanced function materials and their interfaces at the nanoscale
Irvine, J. T. S. (PI), Baker, R. (CoI) & Zhou, W. (CoI)
1/04/18 → 2/09/20
Project: Standard
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Equipment Account: Characterisation and Manipulation of Advanced Functional Materials and their Interfaces at the Nanoscale
Samuel, I. D. W. (PI)
1/10/13 → 30/09/23
Project: Standard
Datasets
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Dataset for Impurity Band Formation as a Route to Thermoelectric Power Factor Enhancement in n‐type XNiSn Half‐Heuslers
Quinn, R. J. (Creator), Go, Y. (Creator), Naden, A. B. (Creator), Bojtor, A. (Creator), Parada, G. (Creator), Shawon, A. (Creator), Domosud, K. (Creator), Refson, K. (Creator), Zevalkink, A. (Creator), Neophytou, N. (Creator) & Bos, J.-W. G. (Creator), University of St Andrews, 13 Jan 2025
DOI: 10.17630/7e1f8a90-1785-4d8b-a2e2-32c7c503b820
Dataset
File