Impedance spectroscopy of epitaxial multiferroic thin films

Rainer Schmidt, Wilma Eerenstein, Thomas Winiecki, Finlay D. Morrison, Paul A. Midgley

Research output: Contribution to journalArticlepeer-review

120 Citations (Scopus)

Abstract

Temperature dependent impedance spectroscopy enables the many contributions to the dielectric and resistive properties of condensed matter to be deconvoluted and characterized separately. We have achieved this for multiferroic epitaxial thin films of BiFeO3 (BFO) and BiMnO3 (BMO), key examples of materials with strong magnetoelectric coupling. We demonstrate that the true film capacitance of the epitaxial layers is similar to that of the electrode interface, making analysis of capacitance as a function of film thickness necessary to achieve deconvolution. We modeled non-Debye impedance response using Gaussian distributions of relaxation times and reveal that conventional resistivity measurements on multiferroic layers may be dominated by interface effects. Thermally activated charge transport models yielded activation energies of 0.60 +/- 0.05 eV (BFO) and 0.25 +/- 0.03 eV (BMO), which is consistent with conduction dominated by oxygen vacancies (BFO) and electron hopping (BMO). The intrinsic film dielectric constants were determined to be 320 +/- 75 (BFO) and 450 +/- 100 (BMO).

Original languageEnglish
Article number245111
Pages (from-to)-
Number of pages8
JournalPhysical Review. B, Condensed matter and materials physics
Volume75
Issue number24
DOIs
Publication statusPublished - Jun 2007

Keywords

  • FERROMAGNETIC PEROVSKITE BIMNO3
  • ROOM-TEMPERATURE
  • FERROELECTRIC POLARIZATION
  • ELECTRIC POLARIZATION
  • BIFEO3
  • HETEROSTRUCTURES
  • CRYSTAL

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