TY - JOUR
T1 - In-situ angle-resolved photoemission spectroscopy of copper-oxide thin films synthesized by molecular beam epitaxy
AU - Kim, Chung Koo
AU - Drozdov, Ilya K.
AU - Fujita, Kazuhiro
AU - Davis, J. C. Séamus
AU - Božović, Ivan
AU - Valla, Tonica
N1 - This research was supported by the U.S. Department of Energy, Office of Basic Energy Sciences, under Contract No. DE-SC0012704. I. K. D. acknowledges the technical support of Robert J. Sundling and the generous financial support of the BNL Gertrude and Maurice Goldhaber Distinguished Fellowship.
PY - 2018/9/8
Y1 - 2018/9/8
N2 - Angle-resolved photoemission spectroscopy (ARPES) is the key momentum-resolved technique for direct probing of the electronic structure of a material. However, since it is highly surface-sensitive, it has been applied to a relatively small set of complex oxides that can be easily cleaved in ultra-high vacuum. Here we describe a new multi-module system at Brookhaven National Laboratory (BNL) in which an oxide molecular beam epitaxy (OMBE) is interconnected with an ARPES and a spectroscopic-imaging scanning tunneling microscopy (SI-STM) module. This new capability largely expands the range of complex-oxide materials and artificial heterostructures accessible to these two most powerful and complementary techniques for studies of electronic structure of materials. We also present the first experimental results obtained using this system — the ARPES studies of electronic band structure of a La2-xSrxCuO4 (LSCO) thin film grown by OMBE.
AB - Angle-resolved photoemission spectroscopy (ARPES) is the key momentum-resolved technique for direct probing of the electronic structure of a material. However, since it is highly surface-sensitive, it has been applied to a relatively small set of complex oxides that can be easily cleaved in ultra-high vacuum. Here we describe a new multi-module system at Brookhaven National Laboratory (BNL) in which an oxide molecular beam epitaxy (OMBE) is interconnected with an ARPES and a spectroscopic-imaging scanning tunneling microscopy (SI-STM) module. This new capability largely expands the range of complex-oxide materials and artificial heterostructures accessible to these two most powerful and complementary techniques for studies of electronic structure of materials. We also present the first experimental results obtained using this system — the ARPES studies of electronic band structure of a La2-xSrxCuO4 (LSCO) thin film grown by OMBE.
KW - Molecular-beam epitaxy
KW - Angle-resolved photoemission spectroscopy
KW - Scanning tunneling microscopy
KW - Electronic properties
KW - High-temperature superconductivity
UR - https://www.scopus.com/pages/publications/85053000739
U2 - 10.1016/j.elspec.2018.07.003
DO - 10.1016/j.elspec.2018.07.003
M3 - Article
SN - 0368-2048
VL - In press
JO - Journal of Electron Spectroscopy and Related Phenomena
JF - Journal of Electron Spectroscopy and Related Phenomena
ER -