HRTEM surface profile imaging of oxides

Wuzong Zhou; JM Thomas

HRTEM surface profile imaging of oxides

Research output: Contribution to journal › Review article › peer-review

Abstract

As an important supplementary technique in surface science, surface profile imaging by high resolution transmission electron microscopy provides surface structural information as well as subterranean structures of solids. The surface-related properties of materials can therefore be better understood. In particular, the application of this technique to the characterisation of nano-scale materials has increased significantly in recent years. (C) 2001 Elsevier Science Ltd. All rights reserved.

Original language	English
Pages (from-to)	75-83
Journal	Current Opinion in Solid State & Materials Science
Volume	5
Publication status	Published - Jan 2001

Keywords

TRANSMISSION ELECTRON-MICROSCOPY
WALLED CARBON NANOTUBES
GOLD NANOPARTICLES
GROWTH
PARTICLES
HREM
COMPOSITES
OXIDATION
CHEMISTRY
YBA2CU4O8

Cite this

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title = "HRTEM surface profile imaging of oxides",

abstract = "As an important supplementary technique in surface science, surface profile imaging by high resolution transmission electron microscopy provides surface structural information as well as subterranean structures of solids. The surface-related properties of materials can therefore be better understood. In particular, the application of this technique to the characterisation of nano-scale materials has increased significantly in recent years. (C) 2001 Elsevier Science Ltd. All rights reserved.",

keywords = "TRANSMISSION ELECTRON-MICROSCOPY, WALLED CARBON NANOTUBES, GOLD NANOPARTICLES, GROWTH, PARTICLES, HREM, COMPOSITES, OXIDATION, CHEMISTRY, YBA2CU4O8",

author = "Wuzong Zhou and JM Thomas",

note = "Curr Opin Solid State Mater Sci",

year = "2001",

month = jan,

language = "English",

volume = "5",

pages = "75--83",

journal = "Current Opinion in Solid State & Materials Science",

publisher = "Elsevier",

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TY - JOUR

T1 - HRTEM surface profile imaging of oxides

AU - Zhou, Wuzong

AU - Thomas, JM

N1 - Curr Opin Solid State Mater Sci

PY - 2001/1

Y1 - 2001/1

N2 - As an important supplementary technique in surface science, surface profile imaging by high resolution transmission electron microscopy provides surface structural information as well as subterranean structures of solids. The surface-related properties of materials can therefore be better understood. In particular, the application of this technique to the characterisation of nano-scale materials has increased significantly in recent years. (C) 2001 Elsevier Science Ltd. All rights reserved.

AB - As an important supplementary technique in surface science, surface profile imaging by high resolution transmission electron microscopy provides surface structural information as well as subterranean structures of solids. The surface-related properties of materials can therefore be better understood. In particular, the application of this technique to the characterisation of nano-scale materials has increased significantly in recent years. (C) 2001 Elsevier Science Ltd. All rights reserved.

KW - TRANSMISSION ELECTRON-MICROSCOPY

KW - WALLED CARBON NANOTUBES

KW - GOLD NANOPARTICLES

KW - GROWTH

KW - PARTICLES

KW - HREM

KW - COMPOSITES

KW - OXIDATION

KW - CHEMISTRY

KW - YBA2CU4O8

M3 - Review article

VL - 5

SP - 75

EP - 83

JO - Current Opinion in Solid State & Materials Science

JF - Current Opinion in Solid State & Materials Science

ER -

HRTEM surface profile imaging of oxides

Abstract

Keywords

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