High speed determination of laser wavelength using Poincaré descriptors of speckle

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Laser speckle can provide a powerful tool that may be used for metrology, for example measurements of the incident laser wavelength with a resolution beyond that which may be achieved in a commercial device. However, to realise highest resolution requires advanced multi-variate analysis techniques, which limit the acquisition rate of such a wavemeter. Here we show an arithmetically simple method to measure wavelength changes with dynamic speckle, based on a Poincarè descriptor of the speckle pattern. We demonstrate the measurement of wavelength changes at femtometer-level with a measurement time reduced by two orders of magnitude compared to the previous state-of-the-art, which offers promise for applications such as speckle-based laser wavelength stabilisation.
Original languageEnglish
Article number124906
Number of pages5
JournalOptics Communications
Early online date11 Nov 2019
Publication statusPublished - 15 Mar 2020


  • Speckle
  • Wavelength measurement
  • Poincaré descriptors


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