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Abstract
Laser speckle can provide a powerful tool that may be used for metrology, for example measurements of the incident laser wavelength with a resolution beyond that which may be achieved in a commercial device. However, to realise highest resolution requires advanced multi-variate analysis techniques, which limit the acquisition rate of such a wavemeter. Here we show an arithmetically simple method to measure wavelength changes with dynamic speckle, based on a Poincarè descriptor of the speckle pattern. We demonstrate the measurement of wavelength changes at femtometer-level with a measurement time reduced by two orders of magnitude compared to the previous state-of-the-art, which offers promise for applications such as speckle-based laser wavelength stabilisation.
Original language | English |
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Article number | 124906 |
Number of pages | 5 |
Journal | Optics Communications |
Volume | 459 |
Early online date | 11 Nov 2019 |
DOIs | |
Publication status | Published - 15 Mar 2020 |
Keywords
- Speckle
- Wavelength measurement
- Poincaré descriptors
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Dive into the research topics of 'High speed determination of laser wavelength using Poincaré descriptors of speckle'. Together they form a unique fingerprint.Projects
- 1 Finished
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Making the most of interference: Making the most of interference: new metrology application of laser speckle
Dholakia, K. (PI)
1/09/17 → 30/11/20
Project: Standard
Datasets
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Data underpinning High speed determination of laser wavelength using Poincaré descriptors of speckle
O'Donnell, L. (Creator), Dholakia, K. (Creator) & Bruce, G. D. (Creator), University of St Andrews, 2019
DOI: 10.17630/4c8eb422-8204-4a3f-ab84-3630070dff2d
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