High-Resolution scanning electron and atomic force microscopies: observation of nanometer features on zeolite Surfaces

Sam Michael Stevens*, Kjell Jansson, Neena S. John, Osamu Terasaki, Michael W. Anderson, Maria Castro, Paul A. Wright, Pablo Cubillas

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingChapter

4 Citations (Scopus)

Abstract

It is now possible to observe nanometer features on the surfaces of zeolitic materials using high-resolution scanning electron microscopy. By taking ibidem measurements in combination with atomic force microscopy we are able to illustrate the strengths and weaknesses of both techniques and judge respective resolving power.

Original languageEnglish
Title of host publicationZeolites and related materials
Subtitle of host publicationTrends, targets and challenges
Pages775-780
Number of pages6
EditionB
DOIs
Publication statusPublished - 10 Nov 2008

Publication series

NameStudies in Surface Science and Catalysis
NumberB
Volume174
ISSN (Print)0167-2991

Keywords

  • AFM
  • HRSEM
  • Ibidem
  • STA-7
  • Zeolite A

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