High-Resolution scanning electron and atomic force microscopies: observation of nanometer features on zeolite Surfaces

Sam Michael Stevens; Kjell Jansson; Neena S. John; Osamu Terasaki; Michael W. Anderson; Maria Castro; Paul A. Wright; Pablo Cubillas

doi:10.1016/S0167-2991(08)80006-7

High-Resolution scanning electron and atomic force microscopies: observation of nanometer features on zeolite Surfaces

Sam Michael Stevens^*, Kjell Jansson, Neena S. John, Osamu Terasaki, Michael W. Anderson, Maria Castro, Paul A. Wright, Pablo Cubillas

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Chapter

Abstract

It is now possible to observe nanometer features on the surfaces of zeolitic materials using high-resolution scanning electron microscopy. By taking ibidem measurements in combination with atomic force microscopy we are able to illustrate the strengths and weaknesses of both techniques and judge respective resolving power.

Original language	English
Title of host publication	Zeolites and related materials
Subtitle of host publication	Trends, targets and challenges
Pages	775-780
Number of pages	6
Edition	B
DOIs	https://doi.org/10.1016/S0167-2991(08)80006-7
Publication status	Published - 10 Nov 2008

Publication series

Name	Studies in Surface Science and Catalysis
Number	B
Volume	174
ISSN (Print)	0167-2991

Keywords

AFM
HRSEM
Ibidem
STA-7
Zeolite A

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10.1016/S0167-2991(08)80006-7

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Stevens, S. M., Jansson, K., John, N. S., Terasaki, O., Anderson, M. W., Castro, M., Wright, P. A., & Cubillas, P. (2008). High-Resolution scanning electron and atomic force microscopies: observation of nanometer features on zeolite Surfaces. In Zeolites and related materials: Trends, targets and challenges (B ed., pp. 775-780). (Studies in Surface Science and Catalysis; Vol. 174, No. B). https://doi.org/10.1016/S0167-2991(08)80006-7

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abstract = "It is now possible to observe nanometer features on the surfaces of zeolitic materials using high-resolution scanning electron microscopy. By taking ibidem measurements in combination with atomic force microscopy we are able to illustrate the strengths and weaknesses of both techniques and judge respective resolving power.",

keywords = "AFM, HRSEM, Ibidem, STA-7, Zeolite A",

author = "Stevens, {Sam Michael} and Kjell Jansson and John, {Neena S.} and Osamu Terasaki and Anderson, {Michael W.} and Maria Castro and Wright, {Paul A.} and Pablo Cubillas",

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series = "Studies in Surface Science and Catalysis",

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Stevens, SM, Jansson, K, John, NS, Terasaki, O, Anderson, MW, Castro, M, Wright, PA & Cubillas, P 2008, High-Resolution scanning electron and atomic force microscopies: observation of nanometer features on zeolite Surfaces. in Zeolites and related materials: Trends, targets and challenges. B edn, Studies in Surface Science and Catalysis, no. B, vol. 174, pp. 775-780. https://doi.org/10.1016/S0167-2991(08)80006-7

High-Resolution scanning electron and atomic force microscopies: observation of nanometer features on zeolite Surfaces. / Stevens, Sam Michael; Jansson, Kjell; John, Neena S. et al.
Zeolites and related materials: Trends, targets and challenges. B. ed. 2008. p. 775-780 (Studies in Surface Science and Catalysis; Vol. 174, No. B).

Research output: Chapter in Book/Report/Conference proceeding › Chapter

TY - CHAP

T1 - High-Resolution scanning electron and atomic force microscopies

T2 - observation of nanometer features on zeolite Surfaces

AU - Stevens, Sam Michael

AU - Jansson, Kjell

AU - John, Neena S.

AU - Terasaki, Osamu

AU - Anderson, Michael W.

AU - Castro, Maria

AU - Wright, Paul A.

AU - Cubillas, Pablo

PY - 2008/11/10

Y1 - 2008/11/10

N2 - It is now possible to observe nanometer features on the surfaces of zeolitic materials using high-resolution scanning electron microscopy. By taking ibidem measurements in combination with atomic force microscopy we are able to illustrate the strengths and weaknesses of both techniques and judge respective resolving power.

AB - It is now possible to observe nanometer features on the surfaces of zeolitic materials using high-resolution scanning electron microscopy. By taking ibidem measurements in combination with atomic force microscopy we are able to illustrate the strengths and weaknesses of both techniques and judge respective resolving power.

KW - AFM

KW - HRSEM

KW - Ibidem

KW - STA-7

KW - Zeolite A

UR - http://www.scopus.com/inward/record.url?scp=55349145961&partnerID=8YFLogxK

U2 - 10.1016/S0167-2991(08)80006-7

DO - 10.1016/S0167-2991(08)80006-7

M3 - Chapter

AN - SCOPUS:55349145961

SN - 9780444532985

T3 - Studies in Surface Science and Catalysis

SP - 775

EP - 780

BT - Zeolites and related materials

ER -

High-Resolution scanning electron and atomic force microscopies: observation of nanometer features on zeolite Surfaces

Abstract

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Keywords

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