High-resolution mapping of the electrostatic potential in organic thin-film transistors by phase electrostatic force microscopy

Paolo Annibale, Cristiano Albonetti, Pablo Stoliar, Fabio Biscarini*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

31 Citations (Scopus)

Abstract

We investigate by a scanning probe technique termed phase-electrostatic force microscopy the local electrostatic potential and its correlation to the morphology of the organic semiconductor layer in operating ultra-thin film pentacene field effect transistors. This technique yields a lateral resolution of about 60 nm, allowing us to visualize that the voltage drop across the transistor channel is step-wise. Spatially localized voltage drops, adding up to about 75% of the potential difference between source and drain, are clearly correlated to the morphological domain boundaries in the pentacene film. This strongly supports and gives a direct evidence that in pentacene ultra-thin film transistors charge transport inside the channel is ultimately governed by domain boundaries.

Original languageEnglish
Pages (from-to)12854-12858
Number of pages5
JournalJournal of Physical Chemistry A
Volume111
Issue number49
DOIs
Publication statusPublished - 13 Dec 2007

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