Gap states at the interface of ultra-thin oxide and organic films on Si(100)

T Bitzer; T Rada; Neville Vincent Richardson; T Dittrich; F Koch

Gap states at the interface of ultra-thin oxide and organic films on Si(100)

T Bitzer, T Rada, Neville Vincent Richardson, T Dittrich, F Koch

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	Ultra Clean Processing of Silicon Surfaces V
Subtitle of host publication	UCPSS 2000
Editors	Marc Heyns, Marc Meuris, Paul Mertens
Publisher	Trans Tech Publications
Pages	131-134
Volume	76-77
ISBN (Electronic)	978-3-908450-57-3
ISBN (Print)	978-3-908450-57-3
Publication status	Published - 2001
Event	5th International Symposium on Ultra Clean Processing of Silicon Surfaces (UCPSS 2000) - Oostende, Belgium Duration: 18 Sept 2000 → 20 Sept 2000

Publication series

Name	Solid State Phenomena
Volume	76-77
ISSN (Print)	1012-0394

Conference

Conference	5th International Symposium on Ultra Clean Processing of Silicon Surfaces (UCPSS 2000)
Country/Territory	Belgium
City	Oostende
Period	18/09/00 → 20/09/00

Cite this

@inproceedings{a980c5ca369f486ba8adc4664bc069c5,

title = "Gap states at the interface of ultra-thin oxide and organic films on Si(100)",

author = "T Bitzer and T Rada and Richardson, {Neville Vincent} and T Dittrich and F Koch",

year = "2001",

language = "English",

isbn = "978-3-908450-57-3",

volume = "76-77",

series = "Solid State Phenomena",

publisher = "Trans Tech Publications",

pages = "131--134",

editor = "Marc Heyns and Marc Meuris and Paul Mertens",

booktitle = "Ultra Clean Processing of Silicon Surfaces V",

address = "Germany",

note = "5th International Symposium on Ultra Clean Processing of Silicon Surfaces (UCPSS 2000) ; Conference date: 18-09-2000 Through 20-09-2000",

}

Bitzer, T, Rada, T, Richardson, NV, Dittrich, T & Koch, F 2001, Gap states at the interface of ultra-thin oxide and organic films on Si(100). in M Heyns, M Meuris & P Mertens (eds), Ultra Clean Processing of Silicon Surfaces V: UCPSS 2000. vol. 76-77, Solid State Phenomena, vol. 76-77, Trans Tech Publications, pp. 131-134, 5th International Symposium on Ultra Clean Processing of Silicon Surfaces (UCPSS 2000), Oostende, Belgium, 18/09/00.

Gap states at the interface of ultra-thin oxide and organic films on Si(100). / Bitzer, T; Rada, T; Richardson, Neville Vincent et al.
Ultra Clean Processing of Silicon Surfaces V: UCPSS 2000. ed. / Marc Heyns; Marc Meuris; Paul Mertens. Vol. 76-77 Trans Tech Publications, 2001. p. 131-134 (Solid State Phenomena; Vol. 76-77).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Gap states at the interface of ultra-thin oxide and organic films on Si(100)

AU - Bitzer, T

AU - Rada, T

AU - Richardson, Neville Vincent

AU - Dittrich, T

AU - Koch, F

PY - 2001

Y1 - 2001

M3 - Conference contribution

SN - 978-3-908450-57-3

VL - 76-77

T3 - Solid State Phenomena

SP - 131

EP - 134

BT - Ultra Clean Processing of Silicon Surfaces V

A2 - Heyns, Marc

A2 - Meuris, Marc

A2 - Mertens, Paul

PB - Trans Tech Publications

T2 - 5th International Symposium on Ultra Clean Processing of Silicon Surfaces (UCPSS 2000)

Y2 - 18 September 2000 through 20 September 2000

ER -