Abstract
Flexoelectricity is an increasingly popular subject because it can be extremely large in thin films and permits switching of devices in nonpolar (non-piezoelectric) crystals via application of inhomogeneous stresses. However, recent work has been limited to macroscopic measurement of voltage or strain. Here, we discuss the vibrational spectroscopy of flexoelectricity as a recommended new tool for thin-film characterization, with special emphasis upon incommensurate crystals.
| Original language | English |
|---|---|
| Article number | 331001 |
| Number of pages | 5 |
| Journal | Journal of Physics: Condensed Matter |
| Volume | 25 |
| Issue number | 33 |
| DOIs | |
| Publication status | Published - 21 Aug 2013 |
Keywords
- PHASE-TRANSITIONS
- THERMODYNAMIC RELATIONS
- LAMBDA-TRANSITION
- CRYSTAL-STRUCTURE
- SRTIO3
- RBH3(SEO3)2
- TUNGSTATES
- SCATTERING
- RB2ZNCL4
- BAMNF4