Ferroelectric thin-film devices: Failure mechanisms and new prototype nano-structures

J. F. Scott; F. D. Morrison; Y. K. Hoo; A. D. Mlliken; H. J. Fan; S. Kawasaki; M. Miyake; T. Tatsuta; O. Tsuji

Ferroelectric thin-film devices: Failure mechanisms and new prototype nano-structures

J. F. Scott, F. D. Morrison, Y. K. Hoo, A. D. Mlliken, H. J. Fan, S. Kawasaki, M. Miyake, T. Tatsuta, O. Tsuji

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Citation (Scopus)

Abstract

Several fundamental physics problems concerning ferroelectric thin films are discussed with direct application to industry problems. The first is a model of dielectric breakdown under d.c. voltage stressing, extended from single capacitor films to multilayer capacitors (MLCs). The second is an analysis of flash-over (arcing) breakdown in MLCs, including those with base metal electrodes (Ni). The third is the demonstration that any equivalent circuit model for real ferroelectric memories (FRAMs) must include a constant phase element (CPE). We then consider novel new prototype devices with industry potential for commercialization: three-dimensional [3D] DRAM capacitor trenches; piezoelectric nanotubes; and carbon nano-wire arrays with ferroelectric tips.

Original language	English
Title of host publication	2007 SIXTEENTH IEEE INTERNATIONAL SYMPOSIUM ON THE APPLICATIONS OF FERROELECTRICS, VOLS 1 AND 2
Place of Publication	NEW YORK
Publisher	IEEE
Pages	58
Number of pages	4
ISBN (Print)	978-1-4244-1333-1
Publication status	Published - 2007
Event	16th IEEE International Symposium on Applications of Ferroelectrics - Nara Duration: 27 May 2007 → 31 May 2007

Conference

Conference	16th IEEE International Symposium on Applications of Ferroelectrics
City	Nara
Period	27/05/07 → 31/05/07

Keywords

SURFACE FLASHOVER
INSULATORS
VACUUM

Royal Society Fellowship 516002.K5799/je: Royal Society Fellowship 516002.K5799/je
Morrison, F. (PI)
The Royal Society
1/08/06 → 30/09/09
Project: Fellowship

Cite this

@inproceedings{60d5094528ad48479a6d67793e212283,

title = "Ferroelectric thin-film devices: Failure mechanisms and new prototype nano-structures",

abstract = "Several fundamental physics problems concerning ferroelectric thin films are discussed with direct application to industry problems. The first is a model of dielectric breakdown under d.c. voltage stressing, extended from single capacitor films to multilayer capacitors (MLCs). The second is an analysis of flash-over (arcing) breakdown in MLCs, including those with base metal electrodes (Ni). The third is the demonstration that any equivalent circuit model for real ferroelectric memories (FRAMs) must include a constant phase element (CPE). We then consider novel new prototype devices with industry potential for commercialization: three-dimensional [3D] DRAM capacitor trenches; piezoelectric nanotubes; and carbon nano-wire arrays with ferroelectric tips.",

keywords = "SURFACE FLASHOVER, INSULATORS, VACUUM",

author = "Scott, {J. F.} and Morrison, {F. D.} and Hoo, {Y. K.} and Mlliken, {A. D.} and Fan, {H. J.} and S. Kawasaki and M. Miyake and T. Tatsuta and O. Tsuji",

year = "2007",

language = "English",

isbn = "978-1-4244-1333-1",

pages = "58",

booktitle = "2007 SIXTEENTH IEEE INTERNATIONAL SYMPOSIUM ON THE APPLICATIONS OF FERROELECTRICS, VOLS 1 AND 2",

publisher = "IEEE",

note = "16th IEEE International Symposium on Applications of Ferroelectrics ; Conference date: 27-05-2007 Through 31-05-2007",

}

Scott, JF, Morrison, FD, Hoo, YK, Mlliken, AD, Fan, HJ, Kawasaki, S, Miyake, M, Tatsuta, T & Tsuji, O 2007, Ferroelectric thin-film devices: Failure mechanisms and new prototype nano-structures. in 2007 SIXTEENTH IEEE INTERNATIONAL SYMPOSIUM ON THE APPLICATIONS OF FERROELECTRICS, VOLS 1 AND 2. IEEE, NEW YORK, pp. 58, 16th IEEE International Symposium on Applications of Ferroelectrics, Nara, 27/05/07.

TY - GEN

T1 - Ferroelectric thin-film devices: Failure mechanisms and new prototype nano-structures

AU - Scott, J. F.

AU - Morrison, F. D.

AU - Hoo, Y. K.

AU - Mlliken, A. D.

AU - Fan, H. J.

AU - Kawasaki, S.

AU - Miyake, M.

AU - Tatsuta, T.

AU - Tsuji, O.

PY - 2007

Y1 - 2007

N2 - Several fundamental physics problems concerning ferroelectric thin films are discussed with direct application to industry problems. The first is a model of dielectric breakdown under d.c. voltage stressing, extended from single capacitor films to multilayer capacitors (MLCs). The second is an analysis of flash-over (arcing) breakdown in MLCs, including those with base metal electrodes (Ni). The third is the demonstration that any equivalent circuit model for real ferroelectric memories (FRAMs) must include a constant phase element (CPE). We then consider novel new prototype devices with industry potential for commercialization: three-dimensional [3D] DRAM capacitor trenches; piezoelectric nanotubes; and carbon nano-wire arrays with ferroelectric tips.

AB - Several fundamental physics problems concerning ferroelectric thin films are discussed with direct application to industry problems. The first is a model of dielectric breakdown under d.c. voltage stressing, extended from single capacitor films to multilayer capacitors (MLCs). The second is an analysis of flash-over (arcing) breakdown in MLCs, including those with base metal electrodes (Ni). The third is the demonstration that any equivalent circuit model for real ferroelectric memories (FRAMs) must include a constant phase element (CPE). We then consider novel new prototype devices with industry potential for commercialization: three-dimensional [3D] DRAM capacitor trenches; piezoelectric nanotubes; and carbon nano-wire arrays with ferroelectric tips.

KW - SURFACE FLASHOVER

KW - INSULATORS

KW - VACUUM

M3 - Conference contribution

SN - 978-1-4244-1333-1

SP - 58

BT - 2007 SIXTEENTH IEEE INTERNATIONAL SYMPOSIUM ON THE APPLICATIONS OF FERROELECTRICS, VOLS 1 AND 2

PB - IEEE

CY - NEW YORK

T2 - 16th IEEE International Symposium on Applications of Ferroelectrics

Y2 - 27 May 2007 through 31 May 2007

ER -

Ferroelectric thin-film devices: Failure mechanisms and new prototype nano-structures

Abstract

Conference

Keywords

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Projects

Royal Society Fellowship 516002.K5799/je: Royal Society Fellowship 516002.K5799/je

Cite this