Experimental visualization of scattering at defects in electronic transport through a single atomic junction

Yong-hui Zhang, Peter Wahl, Klaus Kern

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)
1 Downloads (Pure)

Fingerprint

Dive into the research topics of 'Experimental visualization of scattering at defects in electronic transport through a single atomic junction'. Together they form a unique fingerprint.

Material Science

Physics