Exciton annihilation and diffusion in semiconducting polymers

P. E. Shaw, A. J. Lewis, A. Ruseckas, I. D. W. Samuel

Research output: Chapter in Book/Report/Conference proceedingConference contribution

9 Citations (Scopus)


We show that time-resolved luminescence measurements at high excitation densities can be used to study exciton annihilation and diffusion, and report the results of such measurements on films of P3HT and MEH-PPV. The results fit to an exciton-exciton annihilation model with a time independent annihilation rate gamma, which was measured to be gamma = (2.8 +/- 0.5)x10(-8) cm(3)s(-1) in MEH-PPV and gamma = (5.2 +/- 1)x10(-10) cm(3)s(-3) in P3HT. This implies much faster diffusion in MEH-PPV. Assuming a value of 1 nm for the annihilation radius we evaluated the diffusion length for pristine P3HT in one direction to be 3.2 nm. Annealing of P3HT was found to increase the annihilation rate to (1.1 +/- 0.2)x10(-9) cm(3)s(-1) and the diffusion length to 4.7 nm.

Original languageEnglish
Title of host publicationOrganic Photovoltaics VII
EditorsZH Kafafi, PA Lane
Place of PublicationBELLINGHAM
Number of pages8
ISBN (Print)978-0-8194-6413-2
Publication statusPublished - 2006
EventConference on Organic Photovoltaics VII - San Diego
Duration: 15 Aug 200617 Aug 2006


ConferenceConference on Organic Photovoltaics VII
CitySan Diego


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