Enhancing throughput of disorder based broadband spectrometer using correlated disorder

B. Kumar; S.A. Schulz

doi:10.1117/12.2645034

Enhancing throughput of disorder based broadband spectrometer using correlated disorder

B. Kumar, S.A. Schulz^*

^*Corresponding author for this work

School of Physics and Astronomy

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

We performed numerical simulation and fabrication of a compact and sensitive high-resolution spectrometer, by superimposing controlled disorder on a photonic crystal. This simultaneously creates an in-plane speckle and suppresses out-of-plane scattering. We perform two- dimensional and three- dimensional numerical simulations to demonstrate reduced out-of-plane scattering and enhanced throughput in such disorder-enhanced photonic crystal structures compared to completely disorder structures without any compromise on resolution.

Original language	English
Title of host publication	Emerging applications in silicon photonics III
Editors	Callum G. Littlejohns, Marc Sorel
Place of Publication	Bellingham, WA
Publisher	SPIE
Number of pages	4
ISBN (Electronic)	9781510657410
ISBN (Print)	9781510657403
DOIs	https://doi.org/10.1117/12.2645034
Publication status	Published - 11 Jan 2023
Event	Emerging Applications in Silicon Photonics III - Birmingham, United Kingdom Duration: 6 Dec 2022 → 9 Dec 2022 https://spie.org/PX22/conferencedetails/emerging-applications-in-silicon-photonics?SSO=1

Publication series

Name	Proceedings of SPIE
Volume	12334
ISSN (Print)	0277-786X
ISSN (Electronic)	1996-756X

Conference

Conference	Emerging Applications in Silicon Photonics III
Country/Territory	United Kingdom
City	Birmingham
Period	6/12/22 → 9/12/22
Internet address	https://spie.org/PX22/conferencedetails/emerging-applications-in-silicon-photonics?SSO=1

Keywords

Correlated Disorder
Multiple scattering
Silicon photonics
Spectrometer

Access to Document

10.1117/12.2645034

Kumar-2023-Enhancing-throuput-of-disorder-ProcSPIE-1233408
Copyright © 2023 SPIE. This work has been made available online in accordance with publisher policies or with permission. Permission for further reuse of this content should be sought from the publisher or the rights holder. This is the final published version of the work, which was originally published at https://doi.org/10.1117/12.2645034.
Final published version, 1.11 MB

Cite this

@inproceedings{f00fc323f4bd4755949f1c12a7f9c10b,

title = "Enhancing throughput of disorder based broadband spectrometer using correlated disorder",

abstract = "We performed numerical simulation and fabrication of a compact and sensitive high-resolution spectrometer, by superimposing controlled disorder on a photonic crystal. This simultaneously creates an in-plane speckle and suppresses out-of-plane scattering. We perform two- dimensional and three- dimensional numerical simulations to demonstrate reduced out-of-plane scattering and enhanced throughput in such disorder-enhanced photonic crystal structures compared to completely disorder structures without any compromise on resolution.",

keywords = "Correlated Disorder, Multiple scattering, Silicon photonics, Spectrometer",

author = "B. Kumar and S.A. Schulz",

note = "Funding: This work is funded by EPSRC project EP/V029975/1: ”DIsorder enhanced on-chip spectrometers.”; Emerging Applications in Silicon Photonics III ; Conference date: 06-12-2022 Through 09-12-2022",

year = "2023",

month = jan,

day = "11",

doi = "10.1117/12.2645034",

language = "English",

isbn = "9781510657403 ",

series = "Proceedings of SPIE",

publisher = "SPIE",

editor = "Littlejohns, {Callum G.} and Marc Sorel",

booktitle = "Emerging applications in silicon photonics III",

address = "United States",

url = "https://spie.org/PX22/conferencedetails/emerging-applications-in-silicon-photonics?SSO=1",

}

Kumar, B & Schulz, SA 2023, Enhancing throughput of disorder based broadband spectrometer using correlated disorder. in CG Littlejohns & M Sorel (eds), Emerging applications in silicon photonics III., 1233408, Proceedings of SPIE, vol. 12334, SPIE, Bellingham, WA, Emerging Applications in Silicon Photonics III, Birmingham, United Kingdom, 6/12/22. https://doi.org/10.1117/12.2645034

TY - GEN

T1 - Enhancing throughput of disorder based broadband spectrometer using correlated disorder

AU - Kumar, B.

AU - Schulz, S.A.

N1 - Funding: This work is funded by EPSRC project EP/V029975/1: ”DIsorder enhanced on-chip spectrometers.”

PY - 2023/1/11

Y1 - 2023/1/11

N2 - We performed numerical simulation and fabrication of a compact and sensitive high-resolution spectrometer, by superimposing controlled disorder on a photonic crystal. This simultaneously creates an in-plane speckle and suppresses out-of-plane scattering. We perform two- dimensional and three- dimensional numerical simulations to demonstrate reduced out-of-plane scattering and enhanced throughput in such disorder-enhanced photonic crystal structures compared to completely disorder structures without any compromise on resolution.

AB - We performed numerical simulation and fabrication of a compact and sensitive high-resolution spectrometer, by superimposing controlled disorder on a photonic crystal. This simultaneously creates an in-plane speckle and suppresses out-of-plane scattering. We perform two- dimensional and three- dimensional numerical simulations to demonstrate reduced out-of-plane scattering and enhanced throughput in such disorder-enhanced photonic crystal structures compared to completely disorder structures without any compromise on resolution.

KW - Correlated Disorder

KW - Multiple scattering

KW - Silicon photonics

KW - Spectrometer

UR - https://doi.org/10.1117/12.2670980

U2 - 10.1117/12.2645034

DO - 10.1117/12.2645034

M3 - Conference contribution

SN - 9781510657403

T3 - Proceedings of SPIE

BT - Emerging applications in silicon photonics III

A2 - Littlejohns, Callum G.

A2 - Sorel, Marc

PB - SPIE

CY - Bellingham, WA

T2 - Emerging Applications in Silicon Photonics III

Y2 - 6 December 2022 through 9 December 2022

ER -

Enhancing throughput of disorder based broadband spectrometer using correlated disorder

Abstract

Publication series

Conference

Keywords

Access to Document

Other files and links

Fingerprint

Disorder enhanced on-chip spectrometers: Disorder enhanced on-chip spectrometers

Cite this

Enhancing throughput of disorder based broadband spectrometer using correlated disorder

Abstract

Publication series

Conference

Keywords

Access to Document

Other files and links

Fingerprint

Projects

Disorder enhanced on-chip spectrometers: Disorder enhanced on-chip spectrometers

Cite this