Determining intrinsic sensitivity and the role of multiple scattering in speckle metrology

Morgan Facchin; Saba N. Khan; Kishan Dholakia; Graham D. Bruce

doi:10.1038/s42254-024-00735-y

Determining intrinsic sensitivity and the role of multiple scattering in speckle metrology

Morgan Facchin, Saba N. Khan, Kishan Dholakia, Graham D. Bruce^*

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

Abstract

Speckle patterns are a powerful tool for high-precision metrology, as they allow remarkable performance in relatively simple setups. Nonetheless, researchers in this field follow rather distinct paths due to underappreciated general principles underlying speckle phenomena. Here, we advise on a universal metric of intrinsic speckle sensitivity, and on the advantages and disadvantages of multiple scattering. This will catalyse progress in speckle metrology but will also translate to other domains of disordered optics which are undergoing rapid developments at present.

Original language	English
Pages (from-to)	500-508
Journal	Nature Reviews Physics
Volume	6
Issue number	8
Early online date	19 Jul 2024
DOIs	https://doi.org/10.1038/s42254-024-00735-y
Publication status	Published - Aug 2024

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10.1038/s42254-024-00735-y

Facchin-2025-Determining-intrinsic-sensitivity-AAM-CCBY
Copyright © 2025 the Authors. This work has been made available online in accordance with the University of St Andrews Open Access policy. This accepted manuscript is distributed under the terms of the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original author and source are credited. The final published version of this work is available at https://doi.org/10.1038/s42254-024-00735-y.
Accepted author manuscript, 4.53 MBLicence: CC BY

https://arxiv.org/abs/2403.19301Licence: Other

M Squared - USTAN Biophotonics Nexus: M Sqaured - St Andrews Biophotonics Nexus
Dholakia, K. (PI)
EPSRC
1/11/17 → 31/10/22
Project: Standard
Making the most of interference: Making the most of interference: new metrology application of laser speckle
Dholakia, K. (PI)
The Leverhulme Trust
1/09/17 → 30/11/20
Project: Standard
Resonant and shaped photonics for under: Resonant and shaped photonics for understanding the physical and biomedical world
Dholakia, K. (PI) & Gather, M. C. (CoI)
1/08/17 → 31/07/22
Project: Standard

Data underpinning "Determining intrinsic sensitivity and the role of multiple scattering in speckle metrology"
Facchin, M. (Creator), Khan, S. (Creator), Dholakia, K. (Creator) & Bruce, G. D. (Creator), University of St Andrews, 13 Nov 2024
DOI: 10.17630/bcb2bff1-0d20-454a-89c5-8fd64b9e8ff8
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abstract = "Speckle patterns are a powerful tool for high-precision metrology, as they allow remarkable performance in relatively simple setups. Nonetheless, researchers in this field follow rather distinct paths due to underappreciated general principles underlying speckle phenomena. Here, we advise on a universal metric of intrinsic speckle sensitivity, and on the advantages and disadvantages of multiple scattering. This will catalyse progress in speckle metrology but will also translate to other domains of disordered optics which are undergoing rapid developments at present. ",

author = "Morgan Facchin and Khan, {Saba N.} and Kishan Dholakia and Bruce, {Graham D.}",

note = "Funding: This work was supported by funding from the Leverhulme Trust (RPG-2017-197), the UK Engineering and Physical Sciences Research Council (EP/P030017/1, EP/R004854/1), and the Australian Research Council (FL210100099).",

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doi = "10.1038/s42254-024-00735-y",

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AU - Facchin, Morgan

AU - Khan, Saba N.

AU - Dholakia, Kishan

AU - Bruce, Graham D.

N1 - Funding: This work was supported by funding from the Leverhulme Trust (RPG-2017-197), the UK Engineering and Physical Sciences Research Council (EP/P030017/1, EP/R004854/1), and the Australian Research Council (FL210100099).

PY - 2024/8

Y1 - 2024/8

N2 - Speckle patterns are a powerful tool for high-precision metrology, as they allow remarkable performance in relatively simple setups. Nonetheless, researchers in this field follow rather distinct paths due to underappreciated general principles underlying speckle phenomena. Here, we advise on a universal metric of intrinsic speckle sensitivity, and on the advantages and disadvantages of multiple scattering. This will catalyse progress in speckle metrology but will also translate to other domains of disordered optics which are undergoing rapid developments at present.

AB - Speckle patterns are a powerful tool for high-precision metrology, as they allow remarkable performance in relatively simple setups. Nonetheless, researchers in this field follow rather distinct paths due to underappreciated general principles underlying speckle phenomena. Here, we advise on a universal metric of intrinsic speckle sensitivity, and on the advantages and disadvantages of multiple scattering. This will catalyse progress in speckle metrology but will also translate to other domains of disordered optics which are undergoing rapid developments at present.

U2 - 10.1038/s42254-024-00735-y

DO - 10.1038/s42254-024-00735-y

M3 - Article

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VL - 6

SP - 500

EP - 508

JO - Nature Reviews Physics

JF - Nature Reviews Physics

IS - 8

ER -

Determining intrinsic sensitivity and the role of multiple scattering in speckle metrology

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Projects

M Squared - USTAN Biophotonics Nexus: M Sqaured - St Andrews Biophotonics Nexus

Making the most of interference: Making the most of interference: new metrology application of laser speckle

Resonant and shaped photonics for under: Resonant and shaped photonics for understanding the physical and biomedical world

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