@inproceedings{89d46e6ff4a04091b053aee5b3e6acab,
title = "Detection and quantification of small misalignments in nanometer-sized particles on oxide support systems by the analysis of plan view HREM images",
abstract = "The analysis of Plan View HREM images, using image processing and simulation, to retrieve information about the orientation relationships between small, nanometer-sized, particles and the crystalline support on which they are grown is illustrated. Plan view images are demonstrated to be much more sensitive than edge-on views to rotations of the particles out of perfect alignment relationships. It is also shown how double diffraction effects amplify rotations of very small amplitude. In the diffractograms experimental parameters that measure the relative position of Moire spots with respect to those of the support have been defined and proposed as a way to quantifying rotations of even only a few degrees. Equations to derive the value of the rotation angle from these experimental parameters have been developed.",
keywords = "CATALYST",
author = "Baker, {R T} and Calvino, {J J} and C Lopez-Cartes and C Mira and Perez-Omil, {J A} and Rodriguez-Izquierdo, {J M}",
year = "1999",
language = "English",
isbn = "0-7503-0577-0",
series = " Institute of Physics Conference Series",
publisher = "Institute of Physics",
pages = "537--540",
editor = "C.J. Kiely",
booktitle = "Electron microscopy and analysis 1999: proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference, University of Sheffield, 24-27 August 1999",
address = "United Kingdom",
note = "Biennial Meeting of the Electron Microscopy and Analysis Group of the Institute of Physics (EMAG 99) ; Conference date: 24-08-1999 Through 27-08-1999",
}