Depth-profiling the composition of bimetallic nanoparticles using medium energy ion scattering

J Gustafson, Andrew Richard Haire, Christopher John Baddeley

Research output: Contribution to journalArticlepeer-review

10 Citations (Scopus)

Abstract

The near monolayer depth resolution of medium energy ion scattering is utilized to develop a probe of the depth dependent composition of bimetallic nanoparticles supported on planar oxide supports. The approach fits spectra of scattered ion intensity versus ion energy at well-defined scattering angles taking into account the asymmetric line shape in such spectra and also the depth dependent loss processes encountered by incident ions as they pass through the bimetallic particles.
Original languageEnglish
Pages (from-to)220-224
JournalSurface Science
Volume605
Issue number1-2
Early online date22 Oct 2010
DOIs
Publication statusPublished - Jan 2011

Keywords

  • Medium energy ion scattering (MEIS)
  • Catalysis
  • Gold
  • Palladium
  • Alloys
  • Clusters

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