Depth-profiling the composition of bimetallic nanoparticles using medium energy ion scattering

J Gustafson; Andrew Richard Haire; Christopher John Baddeley

doi:10.1016/j.susc.2010.10.022

Depth-profiling the composition of bimetallic nanoparticles using medium energy ion scattering

J Gustafson, Andrew Richard Haire, Christopher John Baddeley

Research output: Contribution to journal › Article › peer-review

12 Citations (Scopus)

Abstract

The near monolayer depth resolution of medium energy ion scattering is utilized to develop a probe of the depth dependent composition of bimetallic nanoparticles supported on planar oxide supports. The approach fits spectra of scattered ion intensity versus ion energy at well-defined scattering angles taking into account the asymmetric line shape in such spectra and also the depth dependent loss processes encountered by incident ions as they pass through the bimetallic particles.

Original language	English
Pages (from-to)	220-224
Journal	Surface Science
Volume	605
Issue number	1-2
Early online date	22 Oct 2010
DOIs	https://doi.org/10.1016/j.susc.2010.10.022
Publication status	Published - Jan 2011

Keywords

Medium energy ion scattering (MEIS)
Catalysis
Gold
Palladium
Alloys
Clusters

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10.1016/j.susc.2010.10.022

Cite this

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title = "Depth-profiling the composition of bimetallic nanoparticles using medium energy ion scattering",

abstract = "The near monolayer depth resolution of medium energy ion scattering is utilized to develop a probe of the depth dependent composition of bimetallic nanoparticles supported on planar oxide supports. The approach fits spectra of scattered ion intensity versus ion energy at well-defined scattering angles taking into account the asymmetric line shape in such spectra and also the depth dependent loss processes encountered by incident ions as they pass through the bimetallic particles.",

keywords = "Medium energy ion scattering (MEIS), Catalysis, Gold, Palladium, Alloys, Clusters",

author = "J Gustafson and Haire, {Andrew Richard} and Baddeley, {Christopher John}",

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journal = "Surface Science",

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AU - Gustafson, J

AU - Haire, Andrew Richard

AU - Baddeley, Christopher John

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N2 - The near monolayer depth resolution of medium energy ion scattering is utilized to develop a probe of the depth dependent composition of bimetallic nanoparticles supported on planar oxide supports. The approach fits spectra of scattered ion intensity versus ion energy at well-defined scattering angles taking into account the asymmetric line shape in such spectra and also the depth dependent loss processes encountered by incident ions as they pass through the bimetallic particles.

AB - The near monolayer depth resolution of medium energy ion scattering is utilized to develop a probe of the depth dependent composition of bimetallic nanoparticles supported on planar oxide supports. The approach fits spectra of scattered ion intensity versus ion energy at well-defined scattering angles taking into account the asymmetric line shape in such spectra and also the depth dependent loss processes encountered by incident ions as they pass through the bimetallic particles.

KW - Medium energy ion scattering (MEIS)

KW - Catalysis

KW - Gold

KW - Palladium

KW - Alloys

KW - Clusters

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DO - 10.1016/j.susc.2010.10.022

M3 - Article

SN - 0039-6028

VL - 605

SP - 220

EP - 224

JO - Surface Science

JF - Surface Science

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ER -

Depth-profiling the composition of bimetallic nanoparticles using medium energy ion scattering

Abstract

Keywords

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MEIS Investigations EP/E047580/1: MEIS investigations of adsorbate induced segregation at the bimetallic surface of single crystal alloys and supported nanoparticles

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Depth-profiling the composition of bimetallic nanoparticles using medium energy ion scattering

Abstract

Keywords

Access to Document

Other files and links

Fingerprint

Projects

MEIS Investigations EP/E047580/1: MEIS investigations of adsorbate induced segregation at the bimetallic surface of single crystal alloys and supported nanoparticles

Cite this