Defect properties of ZnO and ZnO:P microwires
- Christof P. Dietrich*
- , Matthias Brandt
- , Martin Lange
- , Johannes Kupper
- , Tammo Boentgen
- , Holger von Wenckstern
- , Marius Grundmann
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review