Characterization of two-threshold behavior of the emission from a GaAs microcavity

Jean-Sebastian Tempel*, Franziska Veit, Marc Assmann, Lars E. Kreilkamp, Arash Rahimi-Iman, Andreas Loeffler, Sven Höfling, Stephan Reitzenstein, Lukas Worschech, Alfred Forchel, Manfred Bayer

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

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