Characterisation of size distribution and positional misalignment of nanoscale islands by small-angle X-ray scattering

Georg Heldt*, Philip Thompson, Rajesh V. Chopdekar, Joachim Kohlbrecher, Stephen Lee, Laura J. Heyderman, Thomas Thomson

*Corresponding author for this work

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Abstract

Highly ordered arrays of nanoscale magnetic structures form the basis of artificial spin ices, uniform particles for bio-medical applications, and data storage as Bit Patterned Media. We demonstrate that small-angle X-ray scattering (SAXS) allows the size distribution and the positional alignment of highly ordered arrays to be determined with high spatial and statistical accuracy. The results obtained from the SAXS measurements are compared to an analysis of Scanning Electron Microscopy images and found to be in excellent agreement. This confirms the validity of the technique and demonstrates its potential as a fast, accurate, and statistically reliable method for characterising arrays of ordered nanostructures.

Original languageEnglish
Article number014301
Number of pages8
JournalJournal of Applied Physics
Volume125
Issue number1
DOIs
Publication statusPublished - 2 Jan 2019

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