BASH: A tool for managing BeadArray spatial artefacts

J. M. Cairns, M. J. Dunning, M. E. Ritchie, R. Russell, Andy G. Lynch*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

53 Citations (Scopus)


Summary: With their many replicates and their random layouts, Illumina BeadArrays provide greater scope fordetecting spatial artefacts than do other microarray technologies. They are also robust to artefact exclusion, yet there is a lack of tools that can perform these tasks for Illumina. We present BASH, a tool for this purpose. BASH adopts the concepts of Harshlight, but implements them in a manner that utilizes the unique characteristics of the Illumina technology. Using bead-level data, spatial artefacts of various kinds can thus be identified and excluded from further analyses.

Original languageEnglish
Pages (from-to)2921-2922
Number of pages2
Issue number24
Publication statusPublished - Dec 2008


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