Abstract
By decomposing a linearly polarized light field in terms of plane waves, the elliptic intensity distribution across the focal spot is shown to be determined by the E-vector's longitudinal component. Considering that the Poynting vector's projection onto the optical axis (power flux) is independent of the E-vector's longitudinal component, the power flux cross section has a circular form. Using a near-field scanning optical microscope (NSOM) with a small-aperture metal tip, we show that a glass zone plate (ZP) having a focal length of one wavelength focuses a linearly polarized Gaussian beam into a weak ellipse with the Cartesian axis diameters FWHMx = (0.44 +/- 0.02)lambda and FWHMy = (0.52 +/- 0.02)lambda and the (depth of focus) DOF = (0.75 +/- 0.02)lambda, where lambda is the incident wavelength. The comparison of the experimental and simulation results suggests that NSOM with a hollow pyramidal aluminum-coated tip (with 70 degrees apex and 100 nm diameter aperture) measures the transverse intensity, rather than the power flux or the total intensity. The conclusion that the small-aperture metal tip measures the transverse intensity can be inferred from the Bethe-Bouwkamp theory. (C) 2013 Optical Society of America
Original language | English |
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Pages (from-to) | 330-339 |
Number of pages | 10 |
Journal | Applied Optics |
Volume | 52 |
Issue number | 3 |
DOIs | |
Publication status | Published - 20 Jan 2013 |
Keywords
- BINARY MICROAXICON
- APERTURE
- LIMIT
- DEPTH
- LENS
- FOCUSED EVANESCENT FIELD
- ZONE
- BEAM