Analysing SANS data to determine magnetisation reversal processes in composite perpendicular magnetic recording media using TEM images

Stephen Joseph Shelford Lister, J. Kohlbrecher, Vikash Venkataramana, T. Thomson, Stephen Leslie Lee, K. Takano

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

Abstract

Perpendicular magnetic recording media based on CoCrPt–SiOx thin-films have been studied with polarised small angle neutron scattering (SANSPOL) to probe the local (sub-10 nm) granular structure and its magnetisation distribution. SANSPOL is sensitive to the direction of the magnetisation vector in the grains over a size range of 1–100 nm. This allows the grain size dependent magnetic reversal process to be probed in the recording layer. SANSPOL data can be analysed both using numerical models and through comparison with the granular structure determined using transmission electron microscopy. In this paper we compare these two methods in detail and demonstrate that both approaches arrive at very similar conclusions
Original languageEnglish
Pages (from-to)1142-1146
JournalInternational Journal of Materials Research
Volume102
Issue number9
DOIs
Publication statusPublished - Sept 2011

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