An EPR study at X- and W-band of defects in a-C:H films in the temperature range 5-300 K
- B. J. Jones
- , R. C. Barklie*
- , G. Smith
- , H. El Mkami
- , J. D. Carey
- , S. R.P. Silva
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review