Air exposure induced recombination in PTB7:PC71BM solar cells

Stuart A. J. Thomson, Stephen C. Hogg, Ifor D. W. Samuel, David J. Keeble

Research output: Contribution to journalArticlepeer-review

5 Citations (Scopus)
2 Downloads (Pure)

Abstract

Understanding degradation pathways in organic photovoltaic cells (OPV) is essential to achieve long term device stability and allow commercialisation. Upon exposure to an ambient atmosphere the power conversion efficiency (PCE) of PTB7:PC71BM solar cells, cast using the solvent additive DIO, is markedly reduced. Using electrically detected magnetic resonance (EDMR) spectroscopy, trap sites, which are formed when the blend is exposed to air and DIO, are identified. Spin-Rabi oscillations reveal that the resonance arises from a weakly coupled pair of spin 1/2 species, while selective injection of charge carriers into the cell demonstrates that the spin-pair corresponds to recombination of electrons and holes. The recombination is assigned to holes on the PTB7 recombining with electrons localised to oxygen induced PC71BM trap sites.
Original languageEnglish
Pages (from-to)21926-21935
JournalJournal of Materials Chemistry A
Volume5
Issue number41
Early online date12 Oct 2017
DOIs
Publication statusPublished - 7 Nov 2017

Fingerprint

Dive into the research topics of 'Air exposure induced recombination in PTB7:PC71BM solar cells'. Together they form a unique fingerprint.

Cite this