Abstract
We develop a nanoscopy method with in-depth resolution for layered photonic devices. Photonics often require tailored light field distributions for the operated optical modes and an exact knowledge of the geometry of a device is crucial to assess its performance. We present an acousto-optical nanoscopy method for the characterization of layered photonic structures based on the uniqueness of the light field distributions: for a given wavelength, we record the reflectivity modulation during the transit of a picosecond acoustic pulse. The obtained temporal profile can be linked to the internal light field distribution. From this information, a reverse-engineering procedure allows us to reconstruct the light field and the underlying photonic structure very precisely. We apply this method to the slow light mode of an AlAs/GaAs micropillar resonator and show its validity for the tailored experimental conditions.
Original language | English |
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Pages (from-to) | 588-594 |
Journal | Optica |
Volume | 4 |
Issue number | 6 |
Early online date | 30 May 2017 |
DOIs | |
Publication status | Published - 20 Jun 2017 |