A stiff scanning tunneling microscopy head for measurement at low temperatures and in high magnetic fields

S. C. White, U. R. Singh, P. Wahl

Research output: Contribution to journalArticlepeer-review

26 Citations (Scopus)
1 Downloads (Pure)

Abstract

We have developed a measurement head for scanning tunneling microscopy (STM) and specifically for spectroscopic imaging STM which is optimized for high mechanical stiffness and good thermal conductivity by choice of material. The main components of the microscope head are made of sapphire. Sapphire has been chosen from several competing possibilities based on finite element modeling of the fundamental vibrational modes of the body. We demonstrate operation of the STM head in topographic imaging and tunneling spectroscopy at temperatures down to below 2 K.

Original languageEnglish
Article number113708
Number of pages5
JournalReview of Scientific Instruments
Volume82
Issue number11
DOIs
Publication statusPublished - Nov 2011

Keywords

  • Scanning tunneling microscopy
  • Tunneling
  • Sapphire
  • Vibration testing
  • Superconductivity
  • Vibration resonsonance

Fingerprint

Dive into the research topics of 'A stiff scanning tunneling microscopy head for measurement at low temperatures and in high magnetic fields'. Together they form a unique fingerprint.

Cite this