A laboratory-based Laue X-ray diffraction system for enhanced imaging range and surface grain mapping

William Whitley^*, Chris Stock, Andrew D. Huxley

^*Corresponding author for this work

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Topological Protection and NonEquilibriu: Topological Protection and NonEquilibrium States in Strongly Correlated Electron Systems
Wahl, P. (PI), Baumberger, F. (CoI), Davis, J. C. (CoI), Green, A. (CoI), Hooley, C. (CoI), Keeling, J. M. J. (CoI) & Mackenzie, A. (CoI)
EPSRC
1/09/11 → 31/08/17
Project: Standard