A fault prediction module for a fault tolerant NoC operation

Jarbas Silveira, Mathieu Bodin, Joao Marcelo Ferreira, Alan Cadore Pinheiro, Thais Webber, Cesar Marcon

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

Each new production technology of integrated circuit (IC) drives more transistors area reduction, implying smaller and denser circuits. This scenario allows integrating several Processing Elements (PEs) into the same IC with efficient communication architecture such as the scalable topologies of Network on Chip (NoC). However, these newer production technologies introduce more defects in various parts of the IC that have to be detected and well corrected to prevent malfunction of the IC. This work presents the Fault Prediction Module (FPM), which presents low area consumption and a power circuit based on thresholds enabling to detect link quality, i.e. operating properly, operating with fault tendency or with permanent fault. Additionally, we show how to tune the FPM threshold parameter aiming to use this circuit as a mechanism with comprehensive fault model. The set of experimental results shows the effectiveness of our proposal.

Original languageEnglish
Title of host publicationProceedings of the 16th International Symposium on Quality Electronic Design, ISQED 2015
PublisherIEEE Computer Society
Pages284-288
Number of pages5
ISBN (Electronic)9781479975815
DOIs
Publication statusPublished - 13 Apr 2015
Event16th International Symposium on Quality Electronic Design, ISQED 2015 - Santa Clara, United States
Duration: 2 Mar 20154 Mar 2015

Publication series

NameProceedings - International Symposium on Quality Electronic Design, ISQED
Volume2015-April
ISSN (Print)1948-3287
ISSN (Electronic)1948-3295

Conference

Conference16th International Symposium on Quality Electronic Design, ISQED 2015
Country/TerritoryUnited States
CitySanta Clara
Period2/03/154/03/15

Keywords

  • Fault-tolerance
  • latency evaluation
  • NoC

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