TY - GEN
T1 - A fault prediction module for a fault tolerant NoC operation
AU - Silveira, Jarbas
AU - Bodin, Mathieu
AU - Ferreira, Joao Marcelo
AU - Pinheiro, Alan Cadore
AU - Webber, Thais
AU - Marcon, Cesar
N1 - Publisher Copyright:
© 2015 IEEE.
Copyright:
Copyright 2015 Elsevier B.V., All rights reserved.
PY - 2015/4/13
Y1 - 2015/4/13
N2 - Each new production technology of integrated circuit (IC) drives more transistors area reduction, implying smaller and denser circuits. This scenario allows integrating several Processing Elements (PEs) into the same IC with efficient communication architecture such as the scalable topologies of Network on Chip (NoC). However, these newer production technologies introduce more defects in various parts of the IC that have to be detected and well corrected to prevent malfunction of the IC. This work presents the Fault Prediction Module (FPM), which presents low area consumption and a power circuit based on thresholds enabling to detect link quality, i.e. operating properly, operating with fault tendency or with permanent fault. Additionally, we show how to tune the FPM threshold parameter aiming to use this circuit as a mechanism with comprehensive fault model. The set of experimental results shows the effectiveness of our proposal.
AB - Each new production technology of integrated circuit (IC) drives more transistors area reduction, implying smaller and denser circuits. This scenario allows integrating several Processing Elements (PEs) into the same IC with efficient communication architecture such as the scalable topologies of Network on Chip (NoC). However, these newer production technologies introduce more defects in various parts of the IC that have to be detected and well corrected to prevent malfunction of the IC. This work presents the Fault Prediction Module (FPM), which presents low area consumption and a power circuit based on thresholds enabling to detect link quality, i.e. operating properly, operating with fault tendency or with permanent fault. Additionally, we show how to tune the FPM threshold parameter aiming to use this circuit as a mechanism with comprehensive fault model. The set of experimental results shows the effectiveness of our proposal.
KW - Fault-tolerance
KW - latency evaluation
KW - NoC
UR - http://www.scopus.com/inward/record.url?scp=84944320438&partnerID=8YFLogxK
U2 - 10.1109/ISQED.2015.7085440
DO - 10.1109/ISQED.2015.7085440
M3 - Conference contribution
AN - SCOPUS:84944320438
T3 - Proceedings - International Symposium on Quality Electronic Design, ISQED
SP - 284
EP - 288
BT - Proceedings of the 16th International Symposium on Quality Electronic Design, ISQED 2015
PB - IEEE Computer Society
T2 - 16th International Symposium on Quality Electronic Design, ISQED 2015
Y2 - 2 March 2015 through 4 March 2015
ER -