Translated title of the contribution | Application of high resolution electron microscopy to the studies of superconductors |
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Original language | Chinese |
Pages (from-to) | 17-19 |
Journal | Kexue (in Chinese) |
Volume | 47 |
Issue number | 2 |
Publication status | Published - 1995 |
高分辨率电子显微镜与超导研究
Research output: Contribution to journal › Article › peer-review