高分辨率电子显微镜与超导研究

Translated title of the contribution: Application of high resolution electron microscopy to the studies of superconductors

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Translated title of the contributionApplication of high resolution electron microscopy to the studies of superconductors
Original languageChinese
Pages (from-to)17-19
JournalKexue (in Chinese)
Volume47
Issue number2
Publication statusPublished - 1995

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