Disorder enhanced on-chip spectrometers

Project: Standard

Acronym	Disorder enhanced on-chip spectrometers
Status	Finished
Effective start/end date	1/08/21 → 31/07/24

Performance limit of on-chip speckle spectrometers
Kumar, B., Bruce, G. D., Negro, L. D. & Schulz, S. A., 10 Oct 2025, Online: arXiv, 12 p.
Research output: Working paper › Preprint

Open Access
Flexible holographic metasurfaces for shape dependent imaging and curvature sensing
Xiao, J., Plaskocinski, T., Hunter, R. I., Biabanifard, M., Robertson, D. A., Smith, G. M., Horsley, S., Schulz, S. A. & Di Falco, A., 1 Aug 2024, Metamaterials XIV. MacDonald, K. F., Staude, I. & Zayats, A. V. (eds.). Bellingham, WA: SPIE, Vol. 12990. 7 p. 1299005. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 12990).
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
High-throughput speckle spectrometers based on multifractal scattering media
Kumar, B., Zhu, Y., Dal Negro, L. & Schulz, S. A., 1 Apr 2024, In: Optical Materials Express. 14, 4, p. 944-954
Research output: Contribution to journal › Article › peer-review

Open Access
File

Project Details