Andrew Stuart Bunting

Dr

  • KY16 9SS

    United Kingdom

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  • 2016

    Test structures for the characterisation of conductive carbon produced from photoresist

    Scarfi, S., Smith, S., Tabasnikov, A., Schmuser, I., Blair, E., Bunting, A. S., Walton, A. J., Murray, A. F. & Terry, J. G., 20 May 2016, 2016 29th IEEE International Conference on Microelectronic Test Structures, ICMTS 2016 - Conference Proceedings. Institute of Electrical and Electronics Engineers Inc., Vol. 2016-May. p. 184-189 6 p. 7476204

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    1 Citation (Scopus)
  • 2014

    Characterization and development of materials for an integrated high-temperature sensor using resistive test structures

    Tabasnikov, A., Bunting, A. S., Terry, J. G., Murray, J., Cummins, G., Zhao, C., Zhou, J., Fu, R. Y., Desmulliez, M. P. Y., Walton, A. J. & Smith, S., 1 Jan 2014, 2014 IEEE International Conference on Microelectronic Test Structures, ICMTS 2014 - Conference Proceedings. Institute of Electrical and Electronics Engineers Inc., p. 188-193 6 p. 6841491

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    1 Citation (Scopus)
  • 2013

    Low cost, patterning of human hNT brain cells on parylene-C with UV & IR laser machining

    Raos, B. J., Unsworth, C. P., Costa, J. L., Rohde, C. A., Doyle, C. S., Delivopoulos, E., Murray, A. F., Dickinson, M. E., Simpson, M. C., Graham, E. S. & Bunting, A. S., 31 Oct 2013, 2013 35th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2013. p. 862-865 4 p. 6609637

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • Test structures for electrical evaluation of high aspect ratio TSV arrays fabricated using planarised sacrificial photoresist

    Zhang, R., Li, Y., Murray, J., Bunting, A. S., Smith, S., Dunare, C. C., Stevenson, J. T. M., Desmulliez, M. P. & Walton, A. J., 9 Aug 2013, 2013 IEEE International Conference on Microelectronic Test Structures, ICMTS 2013 - Conference Proceedings. p. 37-42 6 p. 6528142

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    3 Citations (Scopus)
  • 2012

    Modification and characterisation of material hydrophobicity for surface acoustic wave driven microfluidics

    Zou, H., Li, Y., Smith, S., Bunting, A. S., Walton, A. J. & Terry, J. G., 24 May 2012, ICMTS 2012 - 2012 IEEE International Conference on Microelectronic Test Structures. p. 61-65 5 p. 6190614

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    3 Citations (Scopus)
  • 2011

    Test structures and a measurement system for characterising the lifetime of EWOD devices

    Gruber, D., Li, Y., Smith, S., Tiwari, A., Deng, F., Stokes, A. A., Terry, J. G., Bunting, A. S., Mackay, L., Langridge-Smith, P. & Walton, A. J., 9 Sept 2011, 2011 IEEE International Conference on Microelectronic Test Structures - 24th ICMTS Conference Proceedings. p. 80-84 5 p. 5976864

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    2 Citations (Scopus)
  • 2010

    Test structures for characterising the integration of EWOD and SAW technologies for microfluidics

    Li, Y., Fu, Y. Q., Flynn, B. W., Parkes, W., Liu, Y., Brodie, S., Terry, J. G., Haworth, L. I., Bunting, A. S., Stevenson, J. T. M., Smith, S. & Walton, A. J., 29 Jun 2010, 2010 International Conference on Microelectronic Test Structures, 23rd IEEE ICMTS Conference Proceedings. p. 52-57 6 p. 5466861

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    5 Citations (Scopus)
  • 2009

    Multiband micro antenna on silicon substrate

    Haridas, N., Zhang, R., El-Rayis, A., Erdogan, A., Arslan, T., Bunting, A. & Walton, A. J., 21 Sept 2009, 2009 IEEE Aerospace Conference. 4839370

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    5 Citations (Scopus)
  • The integration of EWOD and SAW technologies for improved droplet manipulation and mixing

    Li, Y., Flynn, B. W., Parkes, W., Liu, Y., Feng, Y., Ruthven, A. D., Terry, J. G., Haworth, L. I., Bunting, A., Stevenson, J. T. M., Smith, S., Bobbili, P., Fu, Y. Q. & Walton, A. J., 1 Dec 2009, ESSDERC 2009 - Proceedings of the 39th European Solid-State Device Research Conference. p. 371-374 4 p. 5331396

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    6 Citations (Scopus)
  • 2007

    A process route for fabricating microstrip-coupled Superconducting Transition Edge Sensors giving well-controlled device characteristics

    Glowacka, D. M., Goldie, D. J., Withington, S., Crane, M., Tsaneva, V., Audley, M. D. & Bunting, A., 1 Dec 2007, IRMMW-THz2007 - Conference Digest of the Joint 32nd International Conference on Infrared and Millimetre Waves, and 15th International Conference on Terahertz Electronics. p. 456-457 2 p. 4516579

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • Array based test structure for optical-electrical overlay calibration

    Shulver, B. J. R., Allen, R. A., Walton, A. J., Cresswell', M. W., Stevenson, J. T. M., Smith, S., Bunting, A. S., Dunare, C., Gundlach, A. M., Haworth, L. I., Ross, A. W. S. & Snell, A. J., 27 Sept 2007, 2007 IEEE International Conference on Microelectronic Test Structures, ICMTS - Conference Proceedings. p. 165-170 6 p. 4252426

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • CD reference materials fabricated on monolithic 200 mm wafers for automated metrology tool applications

    Allen, R. A., Dixson, R. G., Cresswell, M. W., Guthrie, W. F., Shulver, B. J. R., Bunting, A. S., Stevenson, J. T. M. & Walton, A. J., 22 Oct 2007, CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2007 International Conference on Frontiers of Characterization and Metrology. Vol. 931. p. 387-391 5 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • Characterisation of a CMP nanoscale planarisation based process for RF MEMS resonators

    Enderling, S., Lin, H., Stevenson, J. T. M., Bunting, A. S. & Walton, A. J., 30 Apr 2007, Micro- and Nanotechnology: Materials, Processes, Packaging, and Systems III. Vol. 6415. 64150G

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • Extraction of sheet resistance and linewidth from all-copper ECD test structures fabricated from silicon preforms

    Shulver, B. J. R., Bunting, A. S., Gundlach, A. M., Haworth, L. I., Ross, A. W. S., Smith, S., Snell, A. J., Stevenson, J. T. M., Walton, A. J., Allen, R. A. & Cresswell, M. W., 27 Sept 2007, 2007 IEEE International Conference on Microelectronic Test Structures, ICMTS - Conference Proceedings. p. 14-19 6 p. 4252397

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • 2006

    Building EWOD microfluidic array technology on top of foundry CMOS

    Li, Y., Li, P., Kazantzis, A., Haworth, L. I., Muir, K., Ross, A. W. S., Terry, J. G., Stevenson, J. T. M., Gundlach, A. M., Bunting, A. & Walton, A. J., 1 Dec 2006, IET Seminar on MEMS Sensors and Actuators. 11367 ed. Vol. 2006. p. 23-30 8 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    7 Citations (Scopus)
  • Design and fabrication of a copper test structure for use as an electrical critical dimension reference

    Shulver, B. J. R., Bunting, A. S., Gundlach, A. M., Haworth, L. I., Ross, A. W. S., Snell, A. J., Stevenson, J. T. M., Walton, A. J., Allen, R. A. & Cresswell, M. W., 13 Oct 2006, 2006 International Conference on Microelectronic Test Structures - Digest of Technical Papers. Vol. 2006. p. 124-129 6 p. 1614288

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • Test structures for the characterisation of MEMS and CMOS integration technology

    Lin, H., Walton, A. J., Dunare, C. C., Stevenson, J. T. M., Gundlach, A. M., Smith, S. & Bunting, A. S., 13 Oct 2006, 2006 International Conference on Microelectronic Test Structures - Digest of Technical Papers. Vol. 2006. p. 143-148 6 p. 1614292

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    4 Citations (Scopus)
  • 1995

    Nanofabrication of II-VI semiconductor quantum wires and dots

    Sotomayor Torres, C. M., Ross, A., Tang, Y. S., Ribayrol, A., Thoms, S., Bunting, A. S., Zhou, H. P., Tsutsui, K., McLelland, H., Wagner, H. P., Lunn, B. & Ashenford, D. E., 1 Jan 1995, University of Glasgow. Vol. 182-184. p. 87-92 6 p. (Materials Science Forum).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    1 Citation (Scopus)