Tuning the epsilon near zero wavelength of ITO in the Near-IR spectral region via post-process free sputtering (dataset)

The data was obtained via experimental measurements. Specifically via ellipsometry measurements using a Woolam Spectroscopic ellipsometer with the measurements described in the manuscript itself.
The data is in the proprietary Woolam data format (.SE file) . A Excel spreadsheet is provided alongside which links each file to the material deposition parameters.
The software needed to open the files is as follows:

for the spreadsheet: Excell or compatible software.
For the raw data files: CompleteEase