Substrate pre-sputtering for layer-by-layer van der Waals epitaxy of 2D materials (dataset)

The data is experimental atomic-force microscopy (AFM) and angle-resolved photoemission spectroscopy (ARPES) data. The AFM data is supplied in .tiff format which can be readily opened with standard graphics software and .gwy format which can be opened with the free Gwyddion software. The ARPES data is included as .csv format, which is array-like data encoding the measured photoemission intensity as a function of energy and momentum. The data can be loaded using multiple standard approaches.