Projects per year
Description
Scanning transmission electron microscopy (STEM) data including energy dispersive X-ray spectroscopy (EDX) and electron energy loss spectroscopy (EELS) data.
file type(s): uncompressed 16-bit TIFFs, EDX line profiles as CSVs, EEL spectra as MSAs (type of text file with a header).
open with: TIFFs - any image editing software; CSVs/MSAs - any software capable of handling text files (e.g. text editors, LibreOffice Calc, Python, Matlab, Origin, etc.).
metadata: TIFFs - stored in headers, can be read using e.g. ImageJ/Fiji (https://imagej.net/formats/metadata); MSAs - stored in text headers
acquisition details: "STEM was performed on a Titan Themis (FEI) operated at 200 kV and equipped with a DCOR probe corrector (CEOS), a SuperX energy dispersive X-ray spectrometer (EDX), and a Gatan Enfinium electron energy loss spectrometer (EELS). High angle annular dark field (HAADF) images were acquired with a probe convergence angle of 21.2 mrad and inner/outer collection angles of 74 and 200 mrad, respectively. EELS spectra were acquired with a collection angle of 8.1 mrad; the background was subtracted using a power-law background, and the spectra were corrected for plural scattering by Fourier ratio deconvolution."
file type(s): uncompressed 16-bit TIFFs, EDX line profiles as CSVs, EEL spectra as MSAs (type of text file with a header).
open with: TIFFs - any image editing software; CSVs/MSAs - any software capable of handling text files (e.g. text editors, LibreOffice Calc, Python, Matlab, Origin, etc.).
metadata: TIFFs - stored in headers, can be read using e.g. ImageJ/Fiji (https://imagej.net/formats/metadata); MSAs - stored in text headers
acquisition details: "STEM was performed on a Titan Themis (FEI) operated at 200 kV and equipped with a DCOR probe corrector (CEOS), a SuperX energy dispersive X-ray spectrometer (EDX), and a Gatan Enfinium electron energy loss spectrometer (EELS). High angle annular dark field (HAADF) images were acquired with a probe convergence angle of 21.2 mrad and inner/outer collection angles of 74 and 200 mrad, respectively. EELS spectra were acquired with a collection angle of 8.1 mrad; the background was subtracted using a power-law background, and the spectra were corrected for plural scattering by Fourier ratio deconvolution."
| Date made available | 25 Mar 2026 |
|---|---|
| Publisher | University of St Andrews |
Projects
- 3 Finished
-
Light Element Analysis Facility (LEAF): Light Element Analysis Facility (LEAF)
Irvine, J. (PI), Baker, R. (CoI) & Miller, D. (CoI)
5/04/20 → 4/04/23
Project: Standard
-
Nanoscale characterization facilities: Nanoscale characterization facilities linking the solution and solid state
Kay, E. (PI) & Smith, A. (CoI)
1/12/18 → 31/05/20
Project: Standard
-
Electon Microscopy: Electon Microscopy for the characterisation and manipulation of advanced function materials and their interfaces at the nanoscale
Irvine, J. (PI), Baker, R. (CoI) & Zhou, W. (CoI)
1/04/18 → 2/09/20
Project: Standard