GatherLab/OLED-jvl-measurement: OLED JVL Characterization

  • Julian Butscher (Creator)
  • francisco-tenopala (Creator)

Dataset

Description

First publication of completely new design of OLED JVL characterization software that allows simple interfacing of different hardware for a smooth user experience for OLED characterization. This includes taking JVL data and angularly resolved spectral data.
Date made available21 Jan 2024
PublisherZenodo

Cite this