Enhancement of catalytic performance in Zr0.1Ce0.9O2-δ through transition metal doping and exsolution (dataset)

  • Haodong Wu (Creator)
  • Bo Yu (Creator)
  • Chengsheng Ni (Southwest University) (Creator)
  • Xiangling Yue (Creator)
  • John Irvine (Creator)

Dataset

Description

The open data folder contains five sub-folders: Raw Catalysis Data, Raw Raman Data, Raw SEM Data, Raw XPS Data, and Raw XRD Data.
 Raw Catalysis Data contains raw catalysis test records in .xlsx format. These files can be opened using spreadsheet software (e.g., Microsoft Excel) and include the original experimental logs and measured outputs recorded during the catalytic performance tests. The reported catalytic metrics were calculated from the chromatograph outputs, and the resulting datasets were used for quantitative evaluation of the catalytic performance of the investigated samples.
 Raw Raman Data contains raw Raman spectra exported in .txt format. These files can be imported into common spectroscopy/plotting software (e.g., Origin, MATLAB, or Python-based tools) and provide the original intensity–wavenumber datasets used for spectral analysis. The spectra were collected using a Raman spectrometer and were used to assess oxygen-vacancy–related spectral features, thereby enabling comparison of the relative oxygen-vacancy signal intensity among different samples.
 Raw SEM Data contains the original scanning electron microscopy images in .tif format. These image files can be opened using standard image-processing software (e.g., ImageJ/Fiji) and correspond to the SEM micrographs presented and analysed in the manuscript.
 Raw XPS Data contains raw X-ray photoelectron spectroscopy datasets in .VGD format. These files can be opened and processed using dedicated XPS analysis software (e.g., CasaXPS), and include the unprocessed spectra for the ten samples discussed in the manuscript. The datasets provide the original photoelectron spectra used to extract surface elemental composition and chemical-state information (e.g., peak positions, line shapes, and fitted component areas) reported in the manuscript.
 Raw XRD Data contains raw X-ray diffraction patterns in .txt format. These files can be imported into common data-analysis software (e.g., Origin, MATLAB, or Python). In each file, the first column corresponds to the diffraction angle 2θ (degrees), and the second column corresponds to the recorded diffraction intensity (counts, a.u.), representing the original patterns used for phase identification and comparison.
Date made available16 Feb 2026
PublisherUniversity of St Andrews

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